CHEN, C. Pattern Recognition Based on YIQ Colour Space with Simulated Annealing Algorithm and Optoelectronic Joint Transform Correlation. European Journal of Applied Sciences, [S. l.], v. 4, n. 5, p. 17, 2016. DOI: 10.14738/aivp.45.2614. Disponível em: http://116.203.177.230/index.php/AIVP/article/view/2614. Acesso em: 24 nov. 2024.