CHANANA, R. K. Minimum Number of Si-C Bilayers Needed in Polytypes of SiC Semiconductor to Exhibit Bandgaps of Bulk Materials. Transactions on Engineering and Computing Sciences, [S. l.], v. 11, n. 4, p. 19–20, 2023. DOI: 10.14738/tecs.114.15080. Disponível em: http://116.203.177.230/index.php/TMLAI/article/view/15080. Acesso em: 23 nov. 2024.